Title :
A novel chopping-spinning MAGFET device
Author :
Frick, VIncent ; Nguyen, Huy Bin ; Hébrard, Luc
Author_Institution :
Inst. d´´Electron. du Solide et des Syst. (InESS), Univ. de Strasbourg, Strasbourg, France
Abstract :
A novel MAGFET device is presented. Its specific architecture allows important noise reduction and thus resolution improvement by using a chopping-spinning technique performed by appropriate conditioning and read-out electronics. Experimental results have been carried out on a first non-optimized device and a sensitivity of 4 mA/T with 52 μT resolution over a bandwidth ranging from 5 Hz to 1.6 kHz have been measured.
Keywords :
field effect transistors; magnetic sensors; semiconductor device noise; chopping-spinning MAGFET; frequency 5 Hz to 1.6 kHz; noise reduction; read-out electronics; Clocks; Nickel; CMOS technology; MAGFET device; chopping-spinning; low-noise; magnetic sensor;
Conference_Titel :
Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on
Conference_Location :
Athens
Print_ISBN :
978-1-4244-8155-2
DOI :
10.1109/ICECS.2010.5724637
