• DocumentCode
    2667883
  • Title

    Improved Ω-Scan for separate measurement of true AT-cutting angles and X-miscutting angles for round quartz blanks

  • Author

    Morys, Bernhard ; Bradaczek, Hans ; Hildebrandt, Gerhard

  • Author_Institution
    Inst. fur Kristallographie, Freie Univ. Berlin, Germany
  • fYear
    1994
  • fDate
    1-3 Jun 1994
  • Firstpage
    237
  • Lastpage
    240
  • Abstract
    The improved Ω-Scan is a new method for measuring the AT-cutting angle of round quartz blanks uninfluenced by an X-tilt. From this true AT-cutting angle the frequency/temperature curve of the quartz oscillator can be calculated. This method combines all positive properties of the known Ω-Scan with the possibility to select even strongly miscutted blanks correctly. To get more information about the cutting orientation of a quartz blank than the simple Ω-Scan was able to obtain, four-instead of two-reflections at two different lattice planes-instead of one-are measured. From the position of these four reflections the true AT-cutting angle and the X-tilt can be determined separately
  • Keywords
    angular measurement; crystal faces; crystal oscillators; cutting; Ω-Scan; X-miscutting angles; X-tilt; cutting orientation; frequency/temperature curve; lattice planes; quartz oscillator; round quartz blanks; true AT-cutting angles; Costs; Error correction; Frequency; Goniometers; Lattices; Optical reflection; Oscillators; Production; Stability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
  • Conference_Location
    Boston, MA
  • Print_ISBN
    0-7803-1945-1
  • Type

    conf

  • DOI
    10.1109/FREQ.1994.398332
  • Filename
    398332