DocumentCode :
2667883
Title :
Improved Ω-Scan for separate measurement of true AT-cutting angles and X-miscutting angles for round quartz blanks
Author :
Morys, Bernhard ; Bradaczek, Hans ; Hildebrandt, Gerhard
Author_Institution :
Inst. fur Kristallographie, Freie Univ. Berlin, Germany
fYear :
1994
fDate :
1-3 Jun 1994
Firstpage :
237
Lastpage :
240
Abstract :
The improved Ω-Scan is a new method for measuring the AT-cutting angle of round quartz blanks uninfluenced by an X-tilt. From this true AT-cutting angle the frequency/temperature curve of the quartz oscillator can be calculated. This method combines all positive properties of the known Ω-Scan with the possibility to select even strongly miscutted blanks correctly. To get more information about the cutting orientation of a quartz blank than the simple Ω-Scan was able to obtain, four-instead of two-reflections at two different lattice planes-instead of one-are measured. From the position of these four reflections the true AT-cutting angle and the X-tilt can be determined separately
Keywords :
angular measurement; crystal faces; crystal oscillators; cutting; Ω-Scan; X-miscutting angles; X-tilt; cutting orientation; frequency/temperature curve; lattice planes; quartz oscillator; round quartz blanks; true AT-cutting angles; Costs; Error correction; Frequency; Goniometers; Lattices; Optical reflection; Oscillators; Production; Stability; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
Type :
conf
DOI :
10.1109/FREQ.1994.398332
Filename :
398332
Link To Document :
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