An analysis of transversely varying thickness modes in trapped energy resonators with shallow contours

Author

Tiersten, H.F. ; Lwo, B.J. ; Dulmet, B.

Author_Institution

Rensselaer Polytech. Inst., Troy, NY, USA

fYear

1994

fDate

1-3 Jun 1994

Firstpage

172

Lastpage

183

Abstract

The equation for transversely varying thickness modes in doubly-rotated quartz resonators is applied in the analysis of contoured resonators with rectangular electrodes. The influence of both the contouring and the continuity conditions at the edges of the electrodes are included in the analysis. The steady-state forced vibrations of contoured trapped energy resonators is treated and a lumped parameter representation of the admittance, which is valid in the vicinity of a resonance, is obtained. Calculated results are presented for a number of trapped energy resonators with shallow contours

Keywords

crystal resonators; electrodes; lumped parameter networks; partial differential equations; FORCED VIBRATIONS; SiO₂; continuity conditions; contoured resonators; contoured trapped energy resonators; doubly-rotated quartz resonators; equation; lumped parameter representation; rectangular electrodes; shallow contours; steady-state forced vibrations; transversely varying thickness modes; trapped energy resonators; Admittance; Differential equations; Eigenvalues and eigenfunctions; Electrodes; Performance analysis; Resonance; Resonant frequency; Steady-state;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International

Conference_Location

Boston, MA

Print_ISBN

0-7803-1945-1

Type

conf

DOI

10.1109/FREQ.1994.398339

Filename

398339