Title :
A CMOS multi-channel IC for pulse timing measurements with 1 mV sensitivity
Author :
Loinaz, M.J. ; Wooley, B.A.
Author_Institution :
Center for Integrated Syst., Stanford Univ., CA, USA
Abstract :
This CMOS data acquisition channel measures the leading-edge timing of pulses relative to a 62.5 MHz system clock, where the input pulses have peak amplitudes in the range of 1 to 10 mV. Such "time-of-occurrence" measurements are required in applications such as laser range-finding, electronics testing, and particle-physics experiments. In this case, the channel is designed for use in a particle-physics instrumentation application requiring a large number (>100,000) of channels with a timing measurement error of less than 0.75 ns r.m.s. The channel consists of a wideband amplifier, a tail-cancellation filter, a timing discriminator, and a time digitizer. For reasons of cost, size, and power dissipation, it is desirable to integrate multiple channels in a single integrated circuit. This implies that the individual subcircuits comprising each channel must be designed so as to generate minimal amounts of switching noise.
Keywords :
timing circuits; 0.75 ns; 1 to 10 mV; 62.5 MHz; CMOS multi-channel IC; data acquisition; integrated circuit; particle-physics instrumentation; pulse timing measurements; switching noise; tail-cancellation filter; time digitizer; time-of-occurrence; timing discriminator; wideband amplifier; CMOS integrated circuits; Clocks; Data acquisition; Electronic equipment testing; Instruments; Laser applications; Measurement errors; Particle measurements; Pulse measurements; Timing;
Conference_Titel :
Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2495-1
DOI :
10.1109/ISSCC.1995.535271