A new method for the determination of concentrations of impurities in quartz crystals

Author

Zecchini, Pierre ; Yamni, Khalid ; Viard, Bernard ; Dothée, Daniel

Author_Institution

Lab. de Cristallographie et Chimie Minerale, Univ. de Franche-Comte, Besancon, France

fYear

1994

fDate

1-3 Jun 1994

Firstpage

91

Lastpage

98

Abstract

Analytical methods, principal component analysis and multivariate regression, have been applied to the spectroscopic infrared data and chemical analyses of quartz crystals in order to find the variations, covariations and internal relationships between data and samples. These analytical methods generate calibration models which can be used for classification and prediction. So differences and likenesses between samples can be well detected. An attempt has been made to get the chemical analysis of crystals by using only a room temperature infrared spectrum. The absorption in the infrared range was measured between 3300 to 3600 cm^-1 and the chemical analyses performed by ICP

Keywords

calibration; infrared spectra; infrared spectroscopy; piezoelectric materials; quartz; spectrochemical analysis; 3300 to 3600 cm^-1; ICP; IR spectroscopy; SiO₂; absorption; calibration models; chemical analyses; concentrations of impurities; internal relationships; multivariate regression; principal component analysis; quartz crystals; room temperature infrared spectrum; spectroscopic infrared data; variations; Calibration; Chemical analysis; Crystals; Impurities; Infrared spectra; Multivariate regression; Predictive models; Principal component analysis; Spectroscopy; Temperature;

fLanguage

English

Publisher

ieee

Conference_Titel

Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International

Conference_Location

Boston, MA

Print_ISBN

0-7803-1945-1

Type

conf

DOI

10.1109/FREQ.1994.398350

Filename

398350