DocumentCode :
2668210
Title :
A new method for the determination of concentrations of impurities in quartz crystals
Author :
Zecchini, Pierre ; Yamni, Khalid ; Viard, Bernard ; Dothée, Daniel
Author_Institution :
Lab. de Cristallographie et Chimie Minerale, Univ. de Franche-Comte, Besancon, France
fYear :
1994
fDate :
1-3 Jun 1994
Firstpage :
91
Lastpage :
98
Abstract :
Analytical methods, principal component analysis and multivariate regression, have been applied to the spectroscopic infrared data and chemical analyses of quartz crystals in order to find the variations, covariations and internal relationships between data and samples. These analytical methods generate calibration models which can be used for classification and prediction. So differences and likenesses between samples can be well detected. An attempt has been made to get the chemical analysis of crystals by using only a room temperature infrared spectrum. The absorption in the infrared range was measured between 3300 to 3600 cm-1 and the chemical analyses performed by ICP
Keywords :
calibration; infrared spectra; infrared spectroscopy; piezoelectric materials; quartz; spectrochemical analysis; 3300 to 3600 cm-1; ICP; IR spectroscopy; SiO2; absorption; calibration models; chemical analyses; concentrations of impurities; internal relationships; multivariate regression; principal component analysis; quartz crystals; room temperature infrared spectrum; spectroscopic infrared data; variations; Calibration; Chemical analysis; Crystals; Impurities; Infrared spectra; Multivariate regression; Predictive models; Principal component analysis; Spectroscopy; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
Type :
conf
DOI :
10.1109/FREQ.1994.398350
Filename :
398350
Link To Document :
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