Title :
Simulation of reflectometer system for complex reflection coefficient measurements
Author :
Kadir, Ermeey Abd ; Rahman, Husna Abd ; Kantasamu, Nesamalar ; Misran, Nor Wahidah Binti
Author_Institution :
Fac. of Electr. Eng., Univ. Teknol., Shah Alam, Malaysia
Abstract :
This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstrip circuit will be fabricated and complex reflection coefficients were measured using Vector Network Analyzer (VNA). A comparison was made between simulations, VNA and publishes data. From the comparison, it shows a close agreement between them. It shows that Microstrip Reflectometer can be used to measure Complex Reflection Coefficient.
Keywords :
microstrip circuits; microwave measurement; reflectivity; reflectometers; Genesys software; complex reflection coefficient; microstrip circuit; microstrip reflectometer; reflection coefficient measurement; reflectometer system; three probe reflectometer measurement system; Capacitors; Integrated circuit modeling; Layout; Microstrip; Reflection; Simulation; Transmission line measurements;
Conference_Titel :
Virtual Environments Human-Computer Interfaces and Measurement Systems (VECIMS), 2010 IEEE International Conference on
Conference_Location :
Taranto
Print_ISBN :
978-1-4244-5904-9
DOI :
10.1109/VECIMS.2010.5609339
