DocumentCode :
2668462
Title :
Resistance Change Due To Electromigration: Correlation To Electrical Performance
Author :
HimIe, J.
Author_Institution :
Maxtor Corporation
fYear :
1997
fDate :
1-4 April 1997
Keywords :
Circuit testing; Current density; Electric resistance; Electromigration; Electrons; Heating; Land surface temperature; Magnetic heads; Pulse measurements; Space vector pulse width modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Magnetics Conference, 1997. Digests of INTERMAG '97., 1997 IEEE International
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-3862-6
Type :
conf
DOI :
10.1109/INTMAG.1997.597828
Filename :
597828
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2668462
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