DocumentCode :
2668463
Title :
Applications of silicon micromachining to resonator fabrication
Author :
Howe, Roger T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
fYear :
1994
fDate :
1-3 Jun 1994
Firstpage :
2
Lastpage :
7
Abstract :
This paper surveys recent developments in using silicon micromachining processes to fabricate micromechanical resonant structures for sensors, filters, and oscillators. Single-crystal silicon and polycrystalline silicon are excellent mechanical materials with quality factors approaching those of quartz. By etching sacrificial layers from a sandwich of thin films, microstructures can be surface micromachined from a deposited polycrystalline silicon (polysilicon) him. This technology can be applied to fabricate micromachined vacuum encapsulation for the resonant structure, as well. Surface micromachining has been merged with CMOS processes to enable fabrication of integrated micro electromechanical systems (MEMS) on a single silicon chip. An alternative process fabricates crystalline silicon resonators by means of wafer bonding and etch-back. These microstructures can be over 10 μm thick-much thicker than surface-micromachined polysilicon structures. Integration with this technology is feasible by processing CMOS electronics on wafers containing sealed cavity microstructures, with the microresonators defined at the end by reactive-ion etching. Trimming silicon microresonators is possible using micromechanical fusing and welding structures, or by electrical tuning
Keywords :
CMOS integrated circuits; VLSI; electromechanical filters; elemental semiconductors; integrated circuit technology; micromachining; micromechanical devices; micromechanical resonators; silicon; wafer bonding; CMOS processes; Si; etch-back; etching; filters; integrated microelectromechanical systems; micromachined vacuum encapsulation; micromechanical fusing; micromechanical resonant structures; microresonators; oscillators; polycrystalline silicon; quality factors; reactive-ion etching; sacrificial layers; sealed cavity microstructures; sensors; silicon micromachining; surface micromachining; surface-micromachined polysilicon structures; thin films; trimming; wafer bonding; CMOS process; CMOS technology; Etching; Fabrication; Microcavities; Micromachining; Micromechanical devices; Microstructure; Resonance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1994. 48th., Proceedings of the 1994 IEEE International
Conference_Location :
Boston, MA
Print_ISBN :
0-7803-1945-1
Type :
conf
DOI :
10.1109/FREQ.1994.398361
Filename :
398361
Link To Document :
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