DocumentCode
2668499
Title
Least-squares technique to determine the second-order nonlinearity of thin films of low symmetry
Author
Siltanen, M. ; Cattaneo, S. ; Ylinen, L. ; Kauramen, M.
Author_Institution
Opt. Lab., Tampere Univ. of Technol., Finland
fYear
2003
fDate
6-6 June 2003
Abstract
We develop a least-squares technique to determine the second-harmonic susceptibility tensor of thin films of low symmetry. The technique avoids the need to calibrate absolute signal levels and allows addressing the quality of various theoretical models.
Keywords
least squares approximations; nonlinear optical susceptibility; optical films; optical harmonic generation; thin films; Least-squares technique; second-harmonic susceptibility; second-order nonlinearity; thin films; Anisotropic magnetoresistance; Equations; Frequency; Geometrical optics; Nonlinear optical devices; Nonlinear optics; Optical films; Optical sensors; Tensile stress; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-749-0
Type
conf
DOI
10.1109/QELS.2003.238046
Filename
1276178
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