Efficient testing of an optical feedback pixel driver using wavelet analysis

A method for testing an optical feedback pixel driver (OFPD) is presented. It is based on the wavelet transformation of the measured output pixel current (I_PIXEL) waveform. In the wavelet analysis, a test metric is introduced which relies on the wavelet energy computation from the trend and detail coefficients of the I_PIXEL waveform. The proposed test method is general and may be applied also for testing other analog and mixed-signal circuits. Comparative simulation results are presented between the proposed method and a method utilizing the calculation of the integral of the I_PIXEL. The results show a +13.33% improvement in fault coverage by using the proposed testing scheme.