Title :
A Structural Approach To Identify Defects In Textured Images
Author :
Chen, Jiahan ; Jain, Anil K.
Author_Institution :
Suzhou Institute of Silk Technology
Keywords :
Computer science; Computer vision; Data structures; Histograms; Image analysis; Image texture analysis; Inspection; Rough surfaces; Skeleton; Surface roughness;
Conference_Titel :
Systems, Man, and Cybernetics, 1988. Proceedings of the 1988 IEEE International Conference on
Print_ISBN :
7-80003-039-3
DOI :
10.1109/ICSMC.1988.754234
