• DocumentCode
    2669223
  • Title

    Avionics/electronics integrity program improves durability of advanced tactical air reconnaissance system

  • Author

    Rosenstein, Leo M.

  • Author_Institution
    Control Data Corp., Minneapolis, MN, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1034
  • Abstract
    Control Data´s development and use of durability analysis, which is part of the Avionics/Electronics Integrity Program (AVIP), in the Advanced Tactical Air Reconnaissance System (ATARS) is described. The durability requirements of the ATARS program, the derivation of the durability profile, the methodology for analysis, plans for verification, and durability testing are discussed. The use of the AVIP concept of durability to put into place a practical, cost-effective program which will result in an improved, more durable, and more available tactical air reconnaissance system for the US Air Force, Navy, and Marine Corps is described. The AVIP for ATARS has resulted in major design improvements, and has had a significant impact on its expected durability. On the ATARS program, the equipment was designed to known environmental criteria, and durability has been designed in; costly redesign and field repairs are unlikely. The AVIP has lowered the life-cycle cost and has increased mission availability of the ATARS hardware
  • Keywords
    aircraft instrumentation; military equipment; reliability; ATARS; AVIP; Advanced Tactical Air Reconnaissance System; Avionics/Electronics Integrity Program; Marine Corps; Navy; US Air Force; advanced tactical air reconnaissance; durability analysis; life-cycle cost; mission availability; verification; Aerospace electronics; Control systems; Failure analysis; Information analysis; Joining processes; Reconnaissance; Satellite ground stations; Testing; Unmanned aerial vehicles; Variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1990.112909
  • Filename
    112909