• DocumentCode
    2669244
  • Title

    Robust process capability index tracking for process qualification

  • Author

    Cong Gu ; McAndrew, Colin C.

  • Author_Institution
    Freescale Semicond., Tempe, AZ, USA
  • fYear
    2015
  • fDate
    23-26 March 2015
  • Firstpage
    54
  • Lastpage
    58
  • Abstract
    This paper presents a robust process qualification and monitoring procedure based on the recently developed YAT and YWL process capability indices. Combined with appropriate test structures and measurements the procedure enables rapid process maturity evaluation and on-going loop closure of manufacturing to process specifications. The procedure generates interactive web-based reports and data that provide high-level “scoring” and a time-line of process capability, an ability to quickly dive down and identify the root cause of issues, and capability to compare between fabs.
  • Keywords
    process monitoring; semiconductor industry; high-level scoring; interactive web-based reports; monitoring procedure; on-going loop closure; process capability; process qualification; rapid process maturity evaluation; robust process capability index tracking; test structures; Profitability; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures (ICMTS), 2015 International Conference on
  • Conference_Location
    Tempe, AZ
  • ISSN
    1071-9032
  • Print_ISBN
    978-1-4799-8302-5
  • Type

    conf

  • DOI
    10.1109/ICMTS.2015.7106108
  • Filename
    7106108