DocumentCode
2669244
Title
Robust process capability index tracking for process qualification
Author
Cong Gu ; McAndrew, Colin C.
Author_Institution
Freescale Semicond., Tempe, AZ, USA
fYear
2015
fDate
23-26 March 2015
Firstpage
54
Lastpage
58
Abstract
This paper presents a robust process qualification and monitoring procedure based on the recently developed YAT and YWL process capability indices. Combined with appropriate test structures and measurements the procedure enables rapid process maturity evaluation and on-going loop closure of manufacturing to process specifications. The procedure generates interactive web-based reports and data that provide high-level “scoring” and a time-line of process capability, an ability to quickly dive down and identify the root cause of issues, and capability to compare between fabs.
Keywords
process monitoring; semiconductor industry; high-level scoring; interactive web-based reports; monitoring procedure; on-going loop closure; process capability; process qualification; rapid process maturity evaluation; robust process capability index tracking; test structures; Profitability; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures (ICMTS), 2015 International Conference on
Conference_Location
Tempe, AZ
ISSN
1071-9032
Print_ISBN
978-1-4799-8302-5
Type
conf
DOI
10.1109/ICMTS.2015.7106108
Filename
7106108
Link To Document