• DocumentCode
    2669290
  • Title

    DAMES program update: methodology, test results, and impact

  • Author

    Ensell, James J.

  • Author_Institution
    ZYCAD Federal Services Group, Mt. Olive, NJ, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1059
  • Abstract
    The testing methodology that has evolved under the demonstration of avionics module exchangeability via simulation (DAMES) program, the program´s accomplishments in the areas of specification analysis and compatibility issue resolution, and some insights into the impact of DAMES accomplishments on the Department of Defense electronic systems procurement process are described. Test development in DAMES is defined as the process by which a comprehensive test suite is developed from an English-language specification. The DAMES specification breakdown process defines a methodology by which a complete set of requirements is extracted from a given specification. The DAMES program allows for testing and evaluation of the effectiveness of JIAWG specifications prior to fabrication. The evaluation is performed through gate-level system simulation of contractor designs using the DAMES methodology. This methodology allows for the demonstration of the effectiveness of current specifications and designs in their support of interoperability and exchangeability. The value of simulations is that they reveal problems and issues that could not be identified through the JIAWG open forum process, thus supporting and enhancing the process
  • Keywords
    CAD; aerospace computing; aircraft instrumentation; digital simulation; military computing; military systems; DAMES program; Department of Defense; English-language specification; JIAWG specifications; Joint Integrated Avionics Working Group; avionics module exchangeability; compatibility; contractor designs; electronic systems procurement; gate-level system simulation; interoperability; simulation; specification analysis; Acceleration; Aerospace electronics; Application software; Application specific integrated circuits; Fabrication; Hardware; Natural languages; Process design; System testing; Time to market;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1990.112914
  • Filename
    112914