• DocumentCode
    2669483
  • Title

    2009 IRPS tutotial program

  • fYear
    2009
  • fDate
    26-30 April 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Provides an abstract for each of the tutorial presentations and a brief professional biography of each presenter. The complete presentations were not made available for publication as part of the conference proceedings.
  • Keywords
    Acceleration; Circuits; Degradation; Electric breakdown; Insulation; Niobium compounds; Plasma temperature; Statistics; Stress; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2009 IEEE International
  • Conference_Location
    Montreal, QC
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-2888-5
  • Type

    conf

  • DOI
    10.1109/IRPS.2009.5173211
  • Filename
    5173211