• DocumentCode
    2669494
  • Title

    SiP technologies: perspectives and challenges

  • Author

    Cauvet, P.

  • Author_Institution
    Philips Semicond., Caen
  • fYear
    2006
  • fDate
    5-7 Sept. 2006
  • Firstpage
    4
  • Lastpage
    4
  • Abstract
    The SiP (System-in-Package) technologies are becoming an important part of the semiconductors, and likely continue to grow in the future, following the market demand in portable applications, such as mobile phones or laptop computers, where the size and the power consumption represent the two major factors for a successful implementation. This paper starts with a brief introduction to the market trends, followed by a description of the various technologies involved: silicon-based, laminate-based substrates, stacked-die, package-on-package, flip-chip, etc. The manufacturing flow was explained in the next part, showing the economical importance of the yield at every process step. An emphasis is made on the wafer test issues, by introducing the "known-good-die" approach. Although this strategy has been used for many years in industries like avionics or aerospace, it represents a big challenge for the mass production of consumer products, where the cost is the key factor. Some emerging solutions were shown, thanks to either hardware enhancements or alternative test techniques. Packaging issues were then addressed, showing some examples of application with different configurations and their characteristics. The trends in packaging technologies demonstrate the needs for permanent innovation in this field. The final test was also discussed, posing the major problems, and describing some of their related solutions, before drawing the conclusions
  • Keywords
    flip-chip devices; integrated circuit economics; integrated circuit testing; integrated circuit yield; laminates; substrates; system-in-package; wafer level packaging; SiP technologies; alternative test techniques; hardware enhancements; known-good-die; manufacturing flow; market trends; packaging issues; packaging technologies; system-in-package; wafer test issues; Aerospace industry; Aerospace testing; Application software; Energy consumption; Manufacturing processes; Mobile handsets; Packaging; Portable computers; Power generation economics; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
  • Conference_Location
    Tunis
  • Print_ISBN
    0-7803-9726-6
  • Type

    conf

  • DOI
    10.1109/DTIS.2006.1708726
  • Filename
    1708726