Title :
Attosecond metrology
Author_Institution :
Clarendon Lab., Oxford Univ., UK
Abstract :
Recent advances in the generation of attosecond-duration electromagnetic pulses demand the development of methods to measure them. The combination of sources and measurement technology provides an important set of tools for the study of electron dynamics in matter of all kinds, I survey several recent proposals for attoseconds metrology, and compare their efficacy and range of applicability.
Keywords :
X-ray optics; electromagnetic wave interferometry; high-speed optical techniques; nonlinear optics; photoelectron spectra; XUV pulse; attosecond metrology; attosecond-duration electromagnetic pulses; electron dynamics; frequency resolved optical gating; nonlinear optical processes; self-referencing interferometry; Electromagnetic measurements; Electron optics; Metrology; Nonlinear optics; Optical filters; Optical interferometry; Optical mixing; Optical pulses; Pulse measurements; Ultrafast optics;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238325
