Title :
Keynote Address 2: SiP Technologies: Perspectives and Challenges
Abstract :
Start of section: Keynote Address 2: SiP Technologies: Perspectives and Challenges
Conference_Titel :
Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
Conference_Location :
Tunis
Print_ISBN :
0-7803-9726-6
DOI :
10.1109/DTIS.2006.1708738