DocumentCode
2669744
Title
New instrumentation for validating performance warranty clauses and obtaining MTBF and maintenance scheduling data
Author
Story, James K.
Author_Institution
Curtis Instrum. Inc., Mt. Kisco, NY, USA
fYear
1990
fDate
21-25 May 1990
Firstpage
1200
Abstract
Curtis Instruments has used advances in CMOS-EEPROM technology to upgrade the state of the art in measuring elapsed-use time and events. The resulting devices, how they work, and applications relative to logistics responsibilities are described. In-application parameters are discussed. Real-world application experience is set forth in a manner that can be related to most electronic, electromechanical, and mechanical equipment. Qualification status is reviewed. Data gathering is addressed to illustrate capabilities for computerized data acquisition. References throughout Department of Defense documentation are cited for the desirability of the discussed tamper-proof acquisition of data to determine warranty status for both performance and mean time between failure (MTBF) incentive programs
Keywords
CMOS integrated circuits; EPROM; computerised instrumentation; data acquisition; integrated memory circuits; maintenance engineering; military computing; military systems; time measurement; CMOS-EEPROM; Curtis Instruments; Department of Defense documentation; MTBF; computerized data acquisition; elapsed-use time; event measurement; in-application parameters; incentive programs; logistics; maintenance scheduling data; mean time between failure; military electronics; semiconductors technology; time measurement; warranty; CMOS logic circuits; EPROM; Instruments; Logic devices; Military aircraft; Nonvolatile memory; Solid state circuits; Voltage; Warranties; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location
Dayton, OH
Type
conf
DOI
10.1109/NAECON.1990.112940
Filename
112940
Link To Document