• DocumentCode
    2669744
  • Title

    New instrumentation for validating performance warranty clauses and obtaining MTBF and maintenance scheduling data

  • Author

    Story, James K.

  • Author_Institution
    Curtis Instrum. Inc., Mt. Kisco, NY, USA
  • fYear
    1990
  • fDate
    21-25 May 1990
  • Firstpage
    1200
  • Abstract
    Curtis Instruments has used advances in CMOS-EEPROM technology to upgrade the state of the art in measuring elapsed-use time and events. The resulting devices, how they work, and applications relative to logistics responsibilities are described. In-application parameters are discussed. Real-world application experience is set forth in a manner that can be related to most electronic, electromechanical, and mechanical equipment. Qualification status is reviewed. Data gathering is addressed to illustrate capabilities for computerized data acquisition. References throughout Department of Defense documentation are cited for the desirability of the discussed tamper-proof acquisition of data to determine warranty status for both performance and mean time between failure (MTBF) incentive programs
  • Keywords
    CMOS integrated circuits; EPROM; computerised instrumentation; data acquisition; integrated memory circuits; maintenance engineering; military computing; military systems; time measurement; CMOS-EEPROM; Curtis Instruments; Department of Defense documentation; MTBF; computerized data acquisition; elapsed-use time; event measurement; in-application parameters; incentive programs; logistics; maintenance scheduling data; mean time between failure; military electronics; semiconductors technology; time measurement; warranty; CMOS logic circuits; EPROM; Instruments; Logic devices; Military aircraft; Nonvolatile memory; Solid state circuits; Voltage; Warranties; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
  • Conference_Location
    Dayton, OH
  • Type

    conf

  • DOI
    10.1109/NAECON.1990.112940
  • Filename
    112940