Title : 
Session 1B: Device Modelling
         
        
        
        
        
        
            Abstract : 
Start of Session 1B: Device Modelling.
         
        
        
        
            Conference_Titel : 
Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
         
        
            Conference_Location : 
Tunis
         
        
            Print_ISBN : 
0-7803-9726-6
         
        
        
            DOI : 
10.1109/DTIS.2006.1708744