مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2669839

Title :

Session 3B: Test Trends and SiP Testing

fYear :

2006

fDate :

5-7 Sept. 2006

Firstpage :

209

Lastpage :

209

Abstract :

Start of Session 3B: Test Trends and SiP Testing.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on

Conference_Location :

Tunis

Print_ISBN :

0-7803-9726-6

Type :

conf

DOI :

10.1109/DTIS.2006.1708748

Filename :

1708748

Link To Document :