مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

2669911

Title :

Session 6B: Defect and Fault Modelling

fYear :

2006

fDate :

5-7 Sept. 2006

Firstpage :

250

Lastpage :

250

Abstract :

Start of Session 6B: Defect and Fault Modelling.

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on

Conference_Location :

Tunis

Print_ISBN :

0-7803-9726-6

Type :

conf

DOI :

10.1109/DTIS.2006.1708753

Filename :

1708753

Link To Document :