DocumentCode :
2669986
Title :
Session 9B: New BIST Techniques
fYear :
2006
fDate :
5-7 Sept. 2006
Firstpage :
262
Lastpage :
262
Abstract :
Start of Session 9B: New BIST Techniques.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on
Conference_Location :
Tunis
Print_ISBN :
0-7803-9726-6
Type :
conf
DOI :
10.1109/DTIS.2006.1708758
Filename :
1708758
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2669986
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