Session 9B: New BIST Techniques

fYear

2006

fDate

5-7 Sept. 2006

Firstpage

262

Lastpage

262

Abstract

Start of Session 9B: New BIST Techniques.

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS 2006. International Conference on

Conference_Location

Tunis

Print_ISBN

0-7803-9726-6

Type

conf

DOI

10.1109/DTIS.2006.1708758

Filename

1708758

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