DocumentCode :
2669995
Title :
Results of the DESC test facility´s efforts to improve the quality of electronic replacement parts
Author :
Robinson, Glenda R. ; McNicholl, Brian P.
Author_Institution :
Defense Electronics Supply Center, Dayton, OH, USA
fYear :
1990
fDate :
21-25 May 1990
Firstpage :
1276
Abstract :
Data indicating an increase in the quality of defense electronics supply center (DESC) sampled devices being supplied for the military services over the last few years are presented. Through continued testing and analysis a database that depicts the overall quality of the electronic parts DESC manages was constructed. DESC manages 93 federal supply classes (FSCs), and the test facility performs incoming inspection on selected new buys, monitors and samples the material in storage, and performs support testing for DESC and other government agencies. Test facility results serve to identify and correct deficient material before it is placed in inventory and to monitor the quality of older devices already in storage. Rejected lots are returned to the manufacturers, corrective actions required, and future purchases of these same and similar part-types screened. Feedback to suppliers and corrective actions are key ingredients to continuously improving the quality of electronic parts received by DESC
Keywords :
inspection; military computing; military systems; quality control; test facilities; DESC; QC; USA; analysis; continued testing; defense electronics supply center; electronic replacement; government agencies; incoming inspection; military services; support testing; test facility; Data analysis; Databases; Electronic equipment testing; Inspection; Material storage; Materials testing; Performance evaluation; Power capacitors; Quality management; Test facilities;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace and Electronics Conference, 1990. NAECON 1990., Proceedings of the IEEE 1990 National
Conference_Location :
Dayton, OH
Type :
conf
DOI :
10.1109/NAECON.1990.112955
Filename :
112955
Link To Document :
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