Title :
Sub-diffraction-limit imaging based on the topographic contrast of differential confocal microscopy
Author :
Chau-Hwang Lee ; Hui-Yu Chiang ; Hong-Yao Mong
Author_Institution :
Inst. of Appl. Sci. & Eng. Res., Acad. Sinica, Taipei, Taiwan
Abstract :
Using the nanometer topographic sensitivity of differential confocal microscopy, we detect surface features with lateral dimensions smaller than the diffraction limit without fluorescence labeling. Lateral resolution as high as 0.2/spl lambda/ is achieved with maximum-likelihood image restoration.
Keywords :
image resolution; image restoration; maximum likelihood estimation; optical microscopy; surface topography; differential confocal microscopy; maximum-likelihood image restoration; subdiffraction-limit imaging; surface features; topographic contrast; Computer vision; Diffraction; Fluorescence; High-resolution imaging; Image resolution; Image restoration; Labeling; Maximum likelihood detection; Microscopy; Surface topography;
Conference_Titel :
Quantum Electronics and Laser Science, 2003. QELS. Postconference Digest
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-749-0
DOI :
10.1109/QELS.2003.238527
