Title : 
Analog CMOS implementation of high frequency least-mean square error learning circuit
         
        
            Author : 
Kub, F.J. ; Justh, E.W.
         
        
            Author_Institution : 
Naval Res. Lab., Washington, DC, USA
         
        
        
        
        
        
            Abstract : 
A continuous-time analog CMOS circuit implementing the least mean square (LMS) adaptive learning algorithm demonstrates a frequency of operation of 80MHz, an adaptivity of 60dB, a minimum notch width of 25KHz, a minimum adapt time constant of 20/spl mu/s, and the simultaneous cancellation of two CW interferers. This frequency of operation is more than an order-of-magnitude greater than that reported for previous integrated analog learning processors. This paper as also describes the first use of an auto-zero circuit to cancel offset voltages of both the integrator and multiplier circuits used for weight learning. The use of the auto zero circuit results in a 20dB higher adaptivity than obtained by previous analog adaptive processors. The high frequency learning circuitry has a number of potential applications for both conventional and neural network signal processing, especially for communication applications.
         
        
            Keywords : 
CMOS analogue integrated circuits; adaptive systems; analogue computer circuits; continuous time systems; learning (artificial intelligence); least mean squares methods; neural chips; 20 mus; 80 MHz; LMS adaptive algorithm; auto-zero circuit; continuous-time analog CMOS circuit; high frequency least-mean square error learning circuit; integrated processor; CMOS analog integrated circuits; Capacitors; Feedback amplifiers; Frequency; Least squares approximation; MOSFET circuits; Operational amplifiers; Signal processing algorithms; Switches; Voltage;
         
        
        
        
            Conference_Titel : 
Solid-State Circuits Conference, 1995. Digest of Technical Papers. 41st ISSCC, 1995 IEEE International
         
        
            Conference_Location : 
San Francisco, CA, USA
         
        
        
            Print_ISBN : 
0-7803-2495-1
         
        
        
            DOI : 
10.1109/ISSCC.1995.535282