DocumentCode :
2670171
Title :
NSEU impact on commercial avionics
Author :
Matthews, David C. ; Dion, Michael J.
Author_Institution :
Commercial Syst. Platform Archit., Rockwell Collins, Inc., Cedar Rapids, IA, USA
fYear :
2009
fDate :
26-30 April 2009
Firstpage :
181
Lastpage :
193
Abstract :
Neutron single event upsets (NSEU) are known to have a significant impact on modern IC´s used in typical ground applications. The impact is orders of magnitude more frequent and critical when IC´s are used in avionics flying at 40,000 ft due to the higher atmospheric neutron flux and the potential for critical impact to human safety. As ICs become more sensitive and as systems use more bits, the systems become more sensitive. Avionics manufacturers use a variety of methods to manage the effects of NSEU, starting in design, through the product assessment process, and into the extended field life of products.
Keywords :
aerospace safety; avionics; integrated circuit design; integrated circuit reliability; neutron effects; radiation hardening (electronics); IC design; NSEU impact; altitude 40000 feet; atmospheric neutron flux; commercial avionics; extended field product life; human safety; neutron single event upsets; product assessment process; Aerospace electronics; CMOS technology; Circuits; Geometry; Hot carriers; MOSFETs; Measurement standards; Radiation hardening; Space technology; Transistors; Avionics; ECC; EDAC; NSEU; Safety-Critical; Upset;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
ISSN :
1541-7026
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2009.5173249
Filename :
5173249
Link To Document :
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