Title :
Reliability framework in a fabless-foundry environment
Author :
Pai, S.Y. ; Lee, J. K Jerry ; Ng, Kenny ; Hsiao, Reality ; Su, K.C. ; Chou, E.N.
Author_Institution :
Reliability Eng. Dept., Xilinx, Inc., San Jose, CA, USA
Abstract :
A collaborative framework is presented to address the reliability challenges faced in a fabless-foundry environment. Examples are given to show the effectiveness of this framework for both infant mortality and long-term reliability risk. Through design-for-reliability, optimum process standardization and selective customization, defect density reduction and electrical screening, reliability of the highest level has been achieved in FPGA devices suitable for enterprise, automotive and aerospace applications, all in a fabless-foundry environment.
Keywords :
field programmable gate arrays; foundries; life testing; product customisation; reliability; standardisation; FPGA devices; defect density reduction; design-for-reliability; electrical screening; fabless-foundry environment; infant mortality; long-term reliability risk; optimum process standardization; selective customization; Collaboration; Field programmable gate arrays; Foundries; Physics; Product design; Production; Reliability engineering; Testing; Thermal stresses; Voltage; Arrhenius Plot; DFR; EVS; FPGA; Fabless; Infant Mortality; Latent Defect; NBTI; Process Change; Wear Out;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2009.5173255
