Title :
Advanced process & product reliability development in fabless environment
Author :
Verma, Gautam ; Wu, Kenneth ; Euzent, Bruce ; Huang, Cheng
Author_Institution :
Altera Corp., San Jose, CA, USA
Abstract :
In this paper, we discuss the methodology used between a foundry and a fabless FPGA component supplier for ensuring a high yielding, reliable FPGA product at an advanced technology node. It is shown that close collaboration between the fabless supplier and foundry in technology development and manufacturing is essential for success. We discuss historical reliability trends as well as reliability data from the latest 40 nm technology, which today is the most advanced technology node for a FPGA in production.
Keywords :
field programmable gate arrays; foundries; integrated circuit reliability; integrated circuit yield; product development; advanced process development; fabless FPGA component supplier; foundry; product reliability development; reliable FPGA product yield; size 40 nm; Circuit synthesis; Collaboration; Failure analysis; Field programmable gate arrays; Foundries; Integrated circuit reliability; Manufacturing; Packaging; Production; Qualifications;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2009.5173256
