DocumentCode
2670305
Title
Qualification & reliability monitoring for small quantity ASIC populations
Author
Alexander, David R. ; Philpy, Stephen ; Pierce, Donald
Author_Institution
Air Force Res. Lab., Albuquerque, NM, USA
fYear
2009
fDate
26-30 April 2009
Firstpage
244
Lastpage
246
Abstract
The authors present a discussion of the issues and an approach for qualification and reliability monitoring for small quantity ASICs used in long lifetime applications. Special attention is given to issues associated with sub-100 nm technologies and the unique challenges posed by new materials and processes.
Keywords
application specific integrated circuits; nanoelectronics; qualifications; reliability; application specific integrated circuits; long lifetime applications; nanoscale ASIC; qualification; reliability monitoring; Application specific integrated circuits; Costs; Electromigration; Fabrication; Foundries; Monitoring; Probes; Qualifications; Temperature measurement; Testing; ASICs; lifetime; qualification; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium, 2009 IEEE International
Conference_Location
Montreal, QC
ISSN
1541-7026
Print_ISBN
978-1-4244-2888-5
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2009.5173257
Filename
5173257
Link To Document