Compensation of operation-related FMAX degradation by adaptive control of circuit operating voltage

Author

Wiatr, M.A. ; Heller, R. ; Hoentschel, J. ; Geilenkeuser, R. ; Wong, S.J. ; Shah, V. ; Mantei, T. ; Majer, M. ; Pruefer, E. ; Scott, C. ; Rodes, T. ; Wieczorek, K. ; Horstmann, M. ; Greenlaw, D.

Author_Institution

Technol. Integration, AMD Saxony LLC & Co. KG, Dresden, Germany

fYear

2009

fDate

26-30 April 2009

Firstpage

266

Lastpage

272

Abstract

The impact of HCI and NBTI on device DC, Ring Oscillator (RO) AC as well as on the degradation of product operating frequency (F_MAX) has been extensively studied. We have developed a method, which allows the compensation of HCI/NBTI-related device and product performance degradation by adaptive control of operating voltage and power for the integrated circuit. Depending on the constraints applied to the product reliability and power, full or partial performance compensation is possible applying our new approach. The win in guard bands and thus a product classification advantage is demonstrated on one of our high-performance microprocessors.

Keywords

adaptive control; integrated circuit reliability; voltage control; HCI/NBTI-related device; adaptive control; adaptive correction; circuit operating voltage; guard bands; high-performance microprocessors; integrated circuit; operation-related FMAX degradation; product classification advantage; product performance degradation; product reliability; ring oscillator; Adaptive control; Degradation; Frequency; Human computer interaction; Niobium compounds; Ring oscillators; Stress; Temperature; Titanium compounds; Voltage; FMAX degradation; adaptive correction; operating voltage; power; product reliability;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium, 2009 IEEE International

Conference_Location

Montreal, QC

ISSN

1541-7026

Print_ISBN

978-1-4244-2888-5

Electronic_ISBN

1541-7026

Type

conf

DOI

10.1109/IRPS.2009.5173261

Filename

5173261