DocumentCode :
2670372
Title :
Emerging post-CMOS switch options - a product reliability perspective
Author :
Bernstein, Kerry
Author_Institution :
IBM, Essex Junction, VT, USA
fYear :
2009
fDate :
26-30 April 2009
Firstpage :
273
Lastpage :
273
Abstract :
Summary form only given: Sooner or later, CMOS scaling will come to an end. What do we do next? A number of very different switches have been proposed as replacements, some of which in fact do not even use electron charge as the state variable. Instead, these switches pass tokens in the spin, excitonic, photonic, magnetic, qubit, or heat domains. The emergent physical behaviors and idiosyncrasies of these novel switches can compliment the execution of specific task algorithms or workloads, and improve overall thru-put in high performance computing. They also present new reliability challenges and perils, however. This talk will describe some of these potential CMOS replacements, how they may be used in design, and the concerns they raise for those who manage product reliability.
Keywords :
CMOS integrated circuits; integrated circuit reliability; semiconductor switches; electron charge; high performance computing; post-CMOS switch; product reliability; Electrons; High performance computing; Magnetic domains; Magnetic switching; Physics; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
ISSN :
1541-7026
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
Type :
conf
DOI :
10.1109/IRPS.2009.5173262
Filename :
5173262
Link To Document :
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