DocumentCode :
2670701
Title :
Large strain-induced conductivity anisotropy in VO2 thin films, probed by THz spectroscopy
Author :
Liu, Mengkun ; Abreu, Elsa ; Lu, Jiwei ; West, Kevin G. ; Kittiwatanakul, Salinport ; Yin, Wenjing ; Wolf, Stuart ; Averitt, Richard D.
Author_Institution :
Dept. of Phys., Boston Univ., Boston, MA, USA
fYear :
2011
fDate :
2-7 Oct. 2011
Firstpage :
1
Lastpage :
2
Abstract :
We probe the temperature dependent far-infrared conductivity of highly strained (100) and (110) VO2 thin films using THz Time Domain Spectroscopy. Large in-plane anisotropy is observed in both the metallic conductivity and the metal-insulator transition temperature.
Keywords :
infrared spectra; metal-insulator transition; optical conductivity; terahertz spectroscopy; terahertz wave spectra; thin films; time-domain analysis; vanadium compounds; THz time domain spectroscopy; VO2; VO2 thin film; in-plane anisotropy; large strain-induced conductivity anisotropy; metal-insulator transition temperature; metallic conductivity; Anisotropic magnetoresistance; Conductivity; Crystals; Doping; Films; Spectroscopy; Strain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
ISSN :
2162-2027
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
Type :
conf
DOI :
10.1109/irmmw-THz.2011.6104810
Filename :
6104810
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2670701
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