• DocumentCode
    2670790
  • Title

    Modeling and prediction of ionospheric total electron content by time series analysis

  • Author

    Xiuhai Li ; Dazhi Guo

  • Author_Institution
    Sch. of Safety & Resource Eng., China Univ. of Min. & Technol. (Beijing), Beijing, China
  • Volume
    2
  • fYear
    2010
  • fDate
    27-29 March 2010
  • Firstpage
    375
  • Lastpage
    379
  • Abstract
    Precise modeling and accurate prediction for the ionospheric total electron content(TEC) are crucial and remain as a challenge for GPS positioning and navigation, space weather forecast, as well as many other Earth Observation System(EOS). This research develops and analyzes a new prediction technique for the regional ionospheric TEC, based on time series analysis theory using autoregressive model (AR) to perform short-term ionospheric TEC prediction. The predicted TEC were then compared with the TEC measured by IGS, and with TEC from the International Reference Ionosphere(IRI) to assess the performance of the model. Preliminary results show that AR model could well describe the variation trend of the regional ionospheric TEC and has a good short-term performance of the ionospheric TEC prediction. The forecasting methodology based on the time series for the regional ionospheric TEC prediction is feasible.
  • Keywords
    electron density; ionosphere; ionospheric techniques; Earth Observation System; GPS navigation; GPS positioning; International GNSS Service; International Reference Ionosphere; autoregressive model; forecasting methodology; ionospheric total electron content; space weather forecast; time series analysis; Economic forecasting; Electrons; Extraterrestrial measurements; Global Positioning System; Ionosphere; Performance analysis; Predictive models; Space technology; Time series analysis; Weather forecasting; AR model; International Reference Ionosphere(IRI); Time Series Analysis; Total electron content(TEC); prediction of TEC;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Computer Control (ICACC), 2010 2nd International Conference on
  • Conference_Location
    Shenyang
  • Print_ISBN
    978-1-4244-5845-5
  • Type

    conf

  • DOI
    10.1109/ICACC.2010.5486653
  • Filename
    5486653