Title :
Wavelet neural networks based fault diagnosis of analog circuit
Author :
Xiaoqin, Liu ; Dazhi, Wang
Author_Institution :
Coll. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
Abstract :
The fault diagnosis of analog circuits has made many ways, such as the fault dictionary method, device parameter identification method and so on. However, due to the diversity of fault types, component tolerances, nonlinear, and the measured response signal usually contains non-stationary and time-varying signal component in the analog circuit failure, the fault diagnosis becomes difficult. Fault diagnosis method based on wavelet neural network can solve these problems. Multisim software is used to establish analog circuits, wavelet neural network is trained by additional momentum term and adaptive learning rate BP algorithm, the characteristics of analog circuit fault is classified and identified, simulation results demonstrate the effectiveness of the method.
Keywords :
analogue circuits; failure analysis; fault diagnosis; learning (artificial intelligence); neural nets; parameter estimation; wavelet transforms; adaptive learning rate BP algorithm; additional momentum term; analog circuit failure; analog circuit fault classification; component tolerances; fault types diversity; multisim software; response signal; time-varying signal component; wavelet neural networks-based fault diagnosis; Decision support systems; Zinc; Analog Circuit; Fault Diagnosis; Wavelet Neural Networks;
Conference_Titel :
Control and Decision Conference (CCDC), 2012 24th Chinese
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4577-2073-4
DOI :
10.1109/CCDC.2012.6244359