Title :
Next step in terahertz multiple scattering modeling: The strongly diffusing structures
Author :
De Dobbeleer, David M. ; Fischer, Bernd M. ; Vandewal, Marijke
Author_Institution :
CISS, Brussels, Belgium
Abstract :
Recently, different approaches to remove artifacts arising from multiple-scattering imprinted THz-TDS data were proposed. We sketch the way ahead for a new fundamental study of the diffusive T-rays, reconsidering the main scattering-related theoretical results and pointing out the limits of existing artifacts-removing experimental methods.
Keywords :
electromagnetic wave scattering; terahertz spectroscopy; terahertz wave spectra; diffusing structures; diffusive T-rays; multiple-scattering imprinted THz-TDS data; terahertz multiple scattering modeling; terahertz time domain spectroscopy; Broadband communication; Imaging; Microstructure; Noise measurement; Numerical models; Photonics; Scattering;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
DOI :
10.1109/irmmw-THz.2011.6104850
