Title :
Replacing current transformers with power current microsensors based on hall ICs without iron cores
Author :
Chen, Nanming ; Chen, Kun-Long ; Tsai, Yuan-Pin
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
Abstract :
Current transformers (CTs) are adopted in power systems to measure magnitudes of currents for metering and fault protection. Since power system fault currents contain large direct current offsets, they can saturate the iron cores of the current transformers. This saturation phenomenon in iron cores will cause the protective system to make false responses. Furthermore, bulky volume of CTs also imposes restriction on their other applications. Hall integrated circuits (ICs) have high sensitivity and quick response time, and can measure a wide range of magnetic fields. Due to these attributes, this research designs a power current microsensor based on a Hall IC without an iron core. The applying Hall IC measures the magnetic field generated by a power cable and subsequently, the electric current flowing in the electric conducting cable. A measurement framework is designed and implemented to compare a series of waveforms obtained by the Hall IC with those measured by a traditional CT. This study assesses the feasibility of replacing traditional CTs with power current microsensors based on Hall ICs.
Keywords :
current transformers; microsensors; power cables; power system faults; power system measurement; power system protection; Hall integrated circuits; current transformers; electric conducting cable; electric current; fault protection; magnetic fields; power cable; power current microsensors; power system fault currents; power system measurement; Current; Current measurement; Integrated circuits; Magnetic field measurement; Magnetic fields; Microsensors; Power measurement; Hall effect; Hall integrated circuit; current transformer; direct current offset; microsensor;
Conference_Titel :
Applied Measurements For Power Systems (AMPS), 2010 IEEE International Workshop on
Conference_Location :
Aachen
Print_ISBN :
978-1-4244-7372-4
DOI :
10.1109/AMPS.2010.5609522