Title :
A two-phase fault simulation scheme for sequential circuits
Author :
Wu, W.C. ; Lee, Chung Len ; Chen, Jwu E.
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., National Chiao Tung Univ., Hsin-Chu, Taiwan
Abstract :
A two-phase fault simulation scheme for sequential circuits is proposed. The scheme is done by first performing the true value simulation with several initial patterns and then by performing the fault simulation with the rest of patterns. With the fault simulation approach, some faults which consume much simulation time can be easily and quickly identified and dropped early. As a result, significant speedup on simulation time is obtained. Five cases of faults which cause problems in fault simulation are also discussed
Keywords :
automatic testing; digital simulation; fault diagnosis; logic testing; sequential circuits; fault simulation; logic testing; sequential circuits; simulation time; true value simulation; two-phase fault simulation; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Electrical fault detection; Fault detection; Fault diagnosis; Flip-flops; Hardware; Sequential circuits;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398780
