Title :
Full chip false timing-path identification
Author :
Zeng, Jing ; Abadir, Magdy ; Bhadra, Jayanta ; Abraham, Jacob
Author_Institution :
Somerset Design Center, Motorola Inc., Austin, TX, USA
Abstract :
Static timing analysis sets the industry standard in the design methodology to gage the speed of high performance microprocessors. Unfortunately, not all the paths identified using such analysis can be sensitized. This leads to a pessimistic estimation of processor speed, and the engineering efforts spent optimizing such paths can not improve the performance of the chip. In the past, we demonstrated initial results of how ATPG technique can be used to eliminate false paths efficiently. Due to the gap between the physical design on which the static timing analysis of the chip is based and the test view on which the ATPG technique is applied to eliminate false paths, in many cases only sections of some of the paths in the full-chip were analyzed in our initial results. In this paper, we fully analyze all the timing paths using the ATPG technique overcoming the gap between the testing and timing analysis techniques. We applied our method on the second G4 PowerPCTM
Keywords :
automatic test pattern generation; integrated circuit testing; microprocessor chips; timing; ATPG technique; G4 PowerPC; design methodology; false critical paths detection; full chip false timing-path identification; high performance microprocessors; industry standard; processor speed estimation; static timing analysis; testing; timing paths; Automatic test pattern generation; Circuits; Computer industry; Design engineering; Design methodology; High performance computing; Jacobian matrices; Performance analysis; Testing; Timing;
Conference_Titel :
Signal Processing Systems, 2000. SiPS 2000. 2000 IEEE Workshop on
Conference_Location :
Lafayette, LA
Print_ISBN :
0-7803-6488-0
DOI :
10.1109/SIPS.2000.886768