DocumentCode :
2671883
Title :
Some investigations on slow and fast arc voltage fluctuations for contact materials proceeding in various gases and direct current
Author :
Ben Jemaa, N. ; Travers, D.
Author_Institution :
Dept. de Physique Atomique et Moleculaire, Rennes I Univ.
fYear :
1990
fDate :
20-24 Aug 1990
Firstpage :
18
Lastpage :
24
Abstract :
Arc voltage fluctuations are studied, taking into account the excitation and ionization potentials of both contact materials and gases. The parameters of the experiments are: the contact material (Au, Ag, . . .) and the environment (air, N2, He, Ar . . .), electrical (50 V, 0.1 to 3 A DC), and mechanical (opening speed 1 to 50 cm/s) parameters. The accurate voltage values of the consecutive arc plateaus included in arc phases are determined by statistical measurements and voltage histograms. Each of these voltage plateaus is attributed to a specific combination of contact metal ionization potential and excitation metastable levels of the surrounding gases. The fast Fourier transform analysis of arc voltage samples shows that the maximum of the spectrum of these fluctuations corresponds to a frequency which is as high as 60 MHz in the metallic phase and only a few megahertz in the gaseous phase
Keywords :
circuit-breaking arcs; electrical contacts; environmental testing; fluctuations; gold; ionisation potential; silver; 0.1 to 3 A; 50 V; Ag; Ar; Au; He; N2; air; arc voltage fluctuations; contact materials; electrical parameters; environmental parameters; excitation metastable levels; fast Fourier transform analysis; gaseous phase; ionization potentials; mechanical parameters; metallic phase; opening speed; statistical measurements; voltage histograms; voltage plateaus; Argon; Contacts; Gases; Gold; Helium; Histograms; Ionization; Phase measurement; Voltage fluctuations; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1990. Proceedings of the Thirty-Sixth IEEE Holm Conference on ... and the Fifteenth International Conference on Electrical Contacts
Conference_Location :
Montreal, Que.
Type :
conf
DOI :
10.1109/HOLM.1990.112989
Filename :
112989
Link To Document :
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