Title :
Optimal interconnect diagnosis
Author :
Shi, Weiping ; Fuchs, Kent W.
Author_Institution :
Dept. of Comput. Sci., North Texas Univ., Denton, TX, USA
Abstract :
Interconnect diagnosis is an important problem in very large scale integration (VLSI), multi-chip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts among a given set of nets using the minimum number of tests. In this paper, we prove matching lower bounds for two non-adaptive diagnosis problems, and give an optimal algorithm for the adaptive diagnosis problem. Our results provide optimal solutions to several open problems in interconnect diagnosis
Keywords :
VLSI; fault diagnosis; integrated circuit interconnections; integrated circuit testing; multichip modules; printed circuit testing; short-circuit currents; MCM; PCB; VLSI; interconnect diagnosis; matching lower bounds; multi-chip module; nonadaptive diagnosis; optimal solutions; printed circuit board; shorts; very large scale integration; Automatic testing; Built-in self-test; Circuit testing; Computer science; Integrated circuit interconnections; Performance evaluation; Printed circuits; Production; System testing; Very large scale integration;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398802
