• DocumentCode
    2672034
  • Title

    Design and implementation of a JTAG boundary-scan interface controller

  • Author

    Shen Xu Baang ; Liang Song Hai

  • Author_Institution
    ShaanXi Microelectron. Res. Inst.
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    In this paper we present an architecture for JTAG boundary-scan interface controller which we have implemented as a basic RISC microprocessor chip. We also present a JTAG test language which makes the interface between machine and users very friendly
  • Keywords
    automatic test equipment; automatic test software; boundary scan testing; microcontrollers; reduced instruction set computing; user interfaces; JTAG boundary-scan interface controller; RISC microprocessor chip; architecture; logic structure; test language; user interface; Clocks; Instruments; Integrated circuit testing; Logic testing; Microelectronics; Microprocessor chips; Probes; Reduced instruction set computing; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398807
  • Filename
    398807