DocumentCode :
2672071
Title :
A new intelligent fabric defect detection and classification system based on Gabor filter and modified Elman neural network
Author :
Zhang, Y.H. ; Yuen, C.W.M. ; Wong, W.K.
Author_Institution :
Inst. of Textile & Clothing, HongKong Polytech. Univ., Hong Kong, China
Volume :
2
fYear :
2010
fDate :
27-29 March 2010
Firstpage :
652
Lastpage :
656
Abstract :
In this paper, one fabric defect detection and classification system based on 2D Gabor wavelet transform and Elman neural network is introduced. In the proposed scheme, the texture features of the textile fabric are extracted by using an optimal 2D Gabor filter. A new modified Elman network is proposed to classify the type of fabric defects which have a proportional (P), integral (I) and derivative (D) properties. The proposed inspecting system in this study is more feasible and applicable in fabric defect detection and classification.
Keywords :
Gabor filters; fabrics; fault location; feature extraction; image classification; inspection; neural nets; production engineering computing; 2D Gabor filter; 2D Gabor wavelet transform; fabric defect classification system; inspecting system; intelligent fabric defect detection; modified Elman neural network; proportional-integral-derivative properties; textile fabric; texture feature extraction; Clothing; Costs; Fabrics; Gabor filters; Image processing; Inspection; Intelligent networks; Neural networks; Production; Textiles; Elman neural networ; Gabor filter; PID; classification; fabric defect detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Computer Control (ICACC), 2010 2nd International Conference on
Conference_Location :
Shenyang
Print_ISBN :
978-1-4244-5845-5
Type :
conf
DOI :
10.1109/ICACC.2010.5486722
Filename :
5486722
Link To Document :
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