Title :
Design of efficient totally self-checking checkers for m-out-of-n code
Author :
Chang, Wen-Feng ; Wu, Cheng-Wen
Author_Institution :
Dept. of Comput. Sci., National Tsin Hua Univ., Hsinchu, Taiwan
Abstract :
This paper presents a new design method of efficient totally self-checking (TSC) checkers for m-out-of-n code. The design procedure has three steps. First, we append an appropriate number of 1´s to the m/n code to get a k/2k code, and design a TSC checker for this k/2k code which can be easily constructed by the conventional method. Then, we delete the appended 1´s and simplify the circuit to get an m/n code checker. Finally, we modify the checker using super gates to meet the self-testing conditions ad get a final TSC m/n code checker. Compared with previous methods, our TSC checker requires significantly less hardware
Keywords :
automatic test equipment; automatic testing; codes; design for testability; logic design; logic testing; m-out-of-n code; super gates; totally self-checking checkers; Built-in self-test; Circuit faults; Computer science; Decoding; Design methodology; Electrical fault detection; Fault detection; Hardware; Milling machines;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398818