DocumentCode
2672212
Title
A Measurement Method for Accurate Characterization and Modeling of MESFET Chips
Author
Peck, D.E. ; Peterson, D.F.
fYear
1981
fDate
15-19 June 1981
Firstpage
310
Lastpage
312
Abstract
A straightforward measurement procedure based on a deembedding method and FET unbiased drain RF measurements is presented that produces accurate chip MESFET characteristics. Usefulness of the data is shown by inexpensively obtained MESFET model parameters.
Keywords
Bonding; Circuits; Electrical resistance measurement; FETs; Frequency measurement; Joining processes; MESFETs; Semiconductor device measurement; Varactors; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1981 IEEE MTT-S International
Conference_Location
Los Angeles, CA, USA
ISSN
0149-645X
Type
conf
DOI
10.1109/MWSYM.1981.1129908
Filename
1129908
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