Title :
A Measurement Method for Accurate Characterization and Modeling of MESFET Chips
Author :
Peck, D.E. ; Peterson, D.F.
Abstract :
A straightforward measurement procedure based on a deembedding method and FET unbiased drain RF measurements is presented that produces accurate chip MESFET characteristics. Usefulness of the data is shown by inexpensively obtained MESFET model parameters.
Keywords :
Bonding; Circuits; Electrical resistance measurement; FETs; Frequency measurement; Joining processes; MESFETs; Semiconductor device measurement; Varactors; Wire;
Conference_Titel :
Microwave Symposium Digest, 1981 IEEE MTT-S International
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/MWSYM.1981.1129908
