• DocumentCode
    2672313
  • Title

    Dielectric measurements and characterization of impurities of photovoltaic cell materials at millimeter and THz waves

  • Author

    Afsar, Mohammed N. ; Chao, Liu ; Korolev, Konstantin A.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Tufts Univ., Medford, MA, USA
  • fYear
    2011
  • fDate
    2-7 Oct. 2011
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Transmittance, Refractive Index, Absorption coefficient, Real and Imaginary part of complex dielectric permittivity data for several Silicon, Silicon Carbide, Gallium Arsenide, Cadmium Telluride and Copper Indium Selenide specimens were measured using Dispersive Fourier Transform Spectroscopy and Free Space Quasi-optical Spectrometer powered by several Backward Wave Oscillators for the characterization of photovoltaic cell materials at Millimeter and THz Waves. Precision measurements easily identifies impurities present in these materials. Data for several silicon carbide (SiC) specimens and powdered Cadmium Telluride specimen over a broad millimeter wave range are shown.
  • Keywords
    absorption coefficients; cadmium compounds; copper compounds; dielectric measurement; gallium arsenide; millimetre wave measurement; permittivity; photovoltaic cells; refractive index; silicon compounds; terahertz materials; THz waves; absorption coefficient; backward wave oscillator; cadmium telluride; copper indium selenide; dielectric measurement; dielectric permittivity; dispersive Fourier transform spectroscopy; free space quasioptical spectrometer; gallium arsenide; impurity characterization; millimeter wave; photovoltaic cell material; refractive index; silicon carbide; transmittance; Dielectric measurements; Dielectrics; Materials; Millimeter wave measurements; Permittivity; Photovoltaic cells; Silicon carbide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
  • Conference_Location
    Houston, TX
  • ISSN
    2162-2027
  • Print_ISBN
    978-1-4577-0510-6
  • Electronic_ISBN
    2162-2027
  • Type

    conf

  • DOI
    10.1109/irmmw-THz.2011.6104890
  • Filename
    6104890