Title :
Reflectivity of pigments in the THz region
Author :
Gallerano, G.P. ; Doria, A. ; Giovenale, E. ; Messina, G. ; Spassovsky, I. ; More, A.C. ; Seracini, M.
Author_Institution :
ENEA, Frascati, Italy
Abstract :
Reflection measurements of pigments used in artworks will be performed in the THz spectral range, utilizing the THz sources available at the ENEA research center of Frascati in collaboration with CISA3, University of California.
Keywords :
art; millimetre wave measurement; pigments; reflection; terahertz waves; THz region; artworks; pigment reflectivity; reflection measurement; Materials; Optical imaging; Optical reflection; Optical variables measurement; Optical waveguides; Pigments;
Conference_Titel :
Infrared, Millimeter and Terahertz Waves (IRMMW-THz), 2011 36th International Conference on
Conference_Location :
Houston, TX
Print_ISBN :
978-1-4577-0510-6
Electronic_ISBN :
2162-2027
DOI :
10.1109/irmmw-THz.2011.6104891
