• DocumentCode
    2672346
  • Title

    Error localization in test outputs: A generalized analysis of signature compression

  • Author

    Demidenko, Serge ; Piuri, Vincenzo ; Ivaniukovich, Alexander

  • Author_Institution
    Inst. of Eng. Cybernetics, Byelorussian Acad. of Sci., Minsk, Byelorussia
  • fYear
    1993
  • fDate
    16-18 Nov 1993
  • Firstpage
    317
  • Lastpage
    322
  • Abstract
    Signature compression is widely used to reduce the volume of information generated by testing. Localization of the faulty component in the system under test, starting from the signature analysis, may be a complex problem related to identification of the erroneous bits in the sequence being compressed and to the error model of the system. A first technique for low-multiplicity errors is based on error effects´ superposition. A novel general solution is derived for any-multiplicity errors from the analytical description of signature compression
  • Keywords
    automatic testing; data compression; logic testing; error localisation; error model; faulty component; identification; logic testing; low-multiplicity errors; multiplicity errors; signature analysis; signature compression; Circuit faults; Circuit testing; Computational Intelligence Society; Cybernetics; Digital circuits; Mission critical systems; Performance evaluation; Polynomials; Registers; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium, 1993., Proceedings of the Second Asian
  • Conference_Location
    Beijing
  • Print_ISBN
    0-8186-3930-X
  • Type

    conf

  • DOI
    10.1109/ATS.1993.398824
  • Filename
    398824