Title :
Proposal for a new integrated circuit and electronics neutron experiment source at oak ridge national laboratory
Author :
Dominik, Laura ; Normand, Eugene ; Dion, Michael J. ; Ferguson, Phillip
Author_Institution :
Aerosp., Honeywell, Inc., Minneapolis, MN, USA
Abstract :
Government and customer specifications increasingly require assessments of the single event effects probability in electronics from atmospheric neutrons. The accelerator that best simulates this neutron spectrum is the WNR facility (Los Alamos), but it is underfunded and oversubscribed for present and future needs. A new beam-line is proposed at the Oak Ridge National Laboratory, as part of the Spallation Neutron Source (SNS).
Keywords :
avionics; neutron effects; nuclear spallation; probability; Spallation Neutron Source; WNR; beam-line; electronics neutron; integrated circuit; neutron spectrum; single event effects probability; Aerospace electronics; Atmospheric modeling; IEC standards; Laboratories; Neutrons; Physics; Proposals; Single event upset; System testing; Test facilities; NSEU; Oak Ridge; SEE; SER; Upset;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2009.5173385
