Title :
A new dedicated neutron facility for accelerated SEE testing at the ISIS facility
Author :
Frost, Christopher D. ; Ansell, Stuart ; Gorini, Giuseppe
Author_Institution :
ISIS Facility, STFC Rutherford Appleton Lab., Didcot, UK
Abstract :
A new neutron facility for the accelerated testing of electronic components is being designed and built in a joint venture between the Science and Technology Facilities Council (UK) and the Consiglio Nazionale delle Ricerche (Italy) at the ISIS Facility, Rutherford Appleton Laboratory, UK. It aims to help address the increasing demand for neutron facilities of this type and in particular provide neutron test facilities with an atmospheric spectrum extending above 200 MeV to 800 MeV.
Keywords :
life testing; neutron effects; semiconductor device reliability; semiconductor device testing; ISIS facility; accelerated SEE testing; electron volt energy 200 MeV to 800 MeV; neutron facility; Aerospace electronics; Aerospace industry; Aerospace testing; Consumer electronics; Electronic equipment testing; Electronics industry; Integrated circuit testing; Intersymbol interference; Life estimation; Neutrons; integrated circuit testing; neutron beams; neutron radiation effects; neutron sources; reliability; thermal neutrons;
Conference_Titel :
Reliability Physics Symposium, 2009 IEEE International
Conference_Location :
Montreal, QC
Print_ISBN :
978-1-4244-2888-5
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2009.5173387
